Micro-Tech Axio Bedienungsanleitung PDF herunterladen (Seite 6)

Axio Vert.A1

Microstructural and

Structural Analysis:

A Question of Contrast.

› In Brief

› The Advantages

› The Applications

› The System

› Technology and Details

› Service

Axio Vert.A1 at Work

Use the contrast method of reﬂected light brightﬁeld to analyze the micro-

structures of etched surfaces. Recognizing grain boundaries, you can draw

conclusions on grain sizes, phases and structural constituents. See colors and

pigments. Detect impurities and structural constituents, such as graphite in

cast iron, prior to etching.

Use the polarization contrast to analyze the structure of anisotropic materials,

such as magnesium, aluminum, bronze and brass. In polarized light, the indi-

vidual grains of crystal lattice will show their characteristic color.

In reﬂected light darkﬁeld, mechanical surface faults such as fracture sites,

pores and inclusions show up just as well as cracks, scratches and cavities.

You can assess the surface quality of processed work pieces precisely, and

make out grain boundaries on etched cuts just as easily.

Alpha-Beta Ti, 500x, darkﬁeld (Photo courtesy: Allied High Tech Products Inc.)Aluminium alloy, 100x, brightﬁeld

Pure magnesium, 100x, polarization

(Photo courtesy: Allied High Tech Products Inc.) Cast aluminium, 500x, C-DIC (Photo courtesy: Allied High Tech Products Inc.)

The Differential Interference Contrast (DIC) lets you detect tiny structural

differences in height with particular sensitivity. Differences in height, whether in

the form of natural differences or artifacts produced by preparation, take on

a 3Deffect as relief-like structures.

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Micro-Tech Axio Bedienungsanleitung Seite 6