
Axio Vert.A1
Microstructural and
Structural Analysis:
A Question of Contrast.
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5
Tailored Precisely to Your Applications
Typical applications,
typical samples
Task Axio Vert.A1 provides
Metallography /
Materialography
Analysis of structure (e.g. phases, grain sizes, texture, precipitates)
and structural defects (e.g. inclusions, porosities, voids, cracks)
Evaluation and documentation via AxioCam and AxioVision
Measurement of layer thicknesses and geometric properties
(e.g. electrode thicknesses)
Inverse design
Field number 23
Analysis of dark samples with minor reflection differences Use of immersion objectives
Analysis of anisotropic samples (e.g. grain size of aluminum alloys by
Barker etching, zinc alloys, graphite, titanium alloys, magnetic materials)
Polarization contrast
Use of high N.A. objectives
Fast switching between contrast methods All common contrast methods
Fast switching of P&C reflector modules via 4x reflector turret
Verification of measurement capability; no mix-up of scaling Encoded 5x nosepiece turret for automatic recognition of selected
magnification
Light manager recognizes illumination intensity
Polymers Thin section samples: assessment of synthetic recyclates; analysis of
pigments, lacquers, carbon blacks, fibers or fillers in transmitted light
Optional carrier for transmitted light illumination
Thin section samples: Spatial distribution of polymer mixtures Optional carrier for transmitted light illumination
Phase contrast
Thin section samples: examination of crystallinity differences, structural
differences, thermal damage, processing influences, cavities, inclusions and
internal mechanical tensions of part-crystalline polymer materials
Optional carrier for transmitted light illumination
Polarization contrast
Fast switching between contrast methods All common contrast methods
Fast switching of P&C reflector modules via 4x reflector turret
Verification of measurement capability; elimination of scaling errors Encoded 5x nosepiece turret for automatic recognition of selected magnification
Light manager recognizes illumination intensity
Building materials /
Betonography
Thin section samples: structural analysis, identification of specific phases
and minerals, and of crystalline structures
Optional carrier for transmitted light illumination
Polarization contrast
Asbestos fibers Thin section samples: Identification of asbestos fibers Optional carrier for transmitted light illumination
Polarization contrast
Thin section samples: quantity and particle size distribution of asbestos fibers Optional carrier for transmitted light illumination
Phase contrast
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